The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2001

Filed:

May. 16, 2000
Applicant:
Inventors:

Klaus Abraham-Fuchs, Erlangen, DE;

Juergen Beuthan, Berlin, DE;

Gerhard-J. Mueller, Berlin, DE;

Viravuth Prapavat, Hamburg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 ;
U.S. Cl.
CPC ...
A61B 5/05 ;
Abstract

In a method and an apparatus for locating an examination size for diaphanoscopic examination of a living subject, a region of the living subject wherein the optimum examination location is suspected is sequentially transilluminated with radiation, preferably in a wavelength range of the optical tissue window, for registration of scattered light distributions in the form of location-related spread functions, particularly point spread functions, and at least one function-specific, location-related feature of each spread function is determined, based on which a position value defining the examination location is determined.


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