The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2001
Filed:
Mar. 31, 2000
Shoji Kuwabara, Osaka, JP;
Shimadzu Corporation, , JP;
Abstract
A fluorescent x-ray analyzer has a light-dispersing crystal and a detector which are rotatable while maintaining a specified angular relationship between them such that fluorescent x-rays from a sample are scanned. A first-order profile and a higher-order profile showing x-ray intensities against scan angle are produced from detection signals from the detector respectively within a different specified range of wavelengths. Data related to ratios between preliminarily measured peak intensities of diffracted beams of first-order and higher-order obtained from a plurality of elements are stored and used to identify peaks in these profiles, if there is a possibility of a peak formed by a first-order spectrum of one element and a higher-order spectrum of another element overlapping each other and the nature and extent of contributions to the peaks in the profiles from the first-order and higher-order spectra are determined.