The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2001
Filed:
Feb. 15, 2000
Applicant:
Inventor:
Richard F Dillman, Andover, MA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 1/500 ;
U.S. Cl.
CPC ...
G01S 1/500 ;
Abstract
A method and system for compensating for steering anomalies by adjusting aperture in steered phased array transducer systems adjusts the aperture of a transducer array to effectively compensate for the steering anomalies. The aperture of the transducer array can be varied depending upon the steering angle of the beam and the resultant steering angle anomalies.
Dillman, Richard. (2001). Method and system for aperture adjustment in steered phased array transducer systems (U.S. Patent No. 6310831). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6310831
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile