The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2001
Filed:
Mar. 31, 1999
Peter A. McEwen, Santa Clara, CA (US);
Bahjat Zafer, Sunnyvale, CA (US);
Kelly K. Fitzpatrick, Westborough, MA (US);
Ke Han, Davis, CA (US);
Steve Aronson, San Jose, CA (US);
Kevin Fisher, Palo Alto, CA (US);
Maxtor Corporation, Longmont, CO (US);
Abstract
A discrete-time filtering method for identifying defects in a magnetic medium, comprising the steps of: reading data signals from at least a portion of the medium; sampling the data signals to generate discrete time sample data; processing the sample data in a discrete time filter to detect deviation of the signal corresponding to media defects; and comparing the deviation of the signal to one or more threshold values to identify corresponding defect types on the recording medium. The filter can be configured to have an impulse response substantially matched to deviation of the signal corresponding to media defects.