The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2001
Filed:
Jun. 18, 1998
Takao Minami, Tokyo, JP;
Nobuaki Takeuchi, Tokyo, JP;
Naoyuki Nozaki, Osaka, JP;
Koichi Shinozaki, Osaka, JP;
Takamu Genji, Osaka, JP;
Other;
Abstract
A testing device performs testing on a multistage multi-branch optical network, which contains optical lines (such as optical fibers) that are connected together at connection points (e.g., optical couplers) in a multistage multi-branch manner. An OTDR measurement device uses software to perform fault determination with respect to the multistage multi-branch optical network. Herein, optical pulses are input to an input end of the multistage multi-branch optical network, wherein they are reflected at certain portions of the optical lines and the connection points while propagating through the optical lines. Then, reflected beams are returned to the input end and are mixed together as response light, which is measured by the OTDR measurement device. The response light is converted to a plurality of digital waveform data representing a measured waveform, which is then divided into multiple ranges on the basis of the Fresnel reflection points and connection points. Separative analysis is performed on the digital waveform data belonging to each of the ranges of the measured waveform. The separative analysis is repeated at measuring times, which are determined in advance. So, the fault determination is made by comparing results of the separative analysis, which are obtained at the measuring times respectively. By the fault determination, it is possible to determine a fault line and a fault location (or fault distance) as well as a fault time.