The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2001

Filed:

May. 10, 2000
Applicant:
Inventor:

Mark R. Samworth, Wilmington, DE (US);

Assignee:

Artwork Systems, Inc., Bristol, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/405 ; H04N 1/52 ;
U.S. Cl.
CPC ...
H04N 1/405 ; H04N 1/52 ;
Abstract

A method for developing calibration curves and for calibrating a halftone imaging device to reproduce on an imaging medium gray scale values equal to input gray scale values entered in said imaging device. According to this method a calibration function representing a linear change in reproduced halftone dot size on said imaging medium as a function of input halftone dot size is developed by using the device to reproduce on an imaging medium at least two test input dot values representing two different % halftone dot sizes and determining a linear change between the input and the reproduced halftone dot sizes. The dot growth is used to predict dot changes for other % halftone dots and thus construct calibration curves which may be used to calibrate the imaging device.


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