The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2001

Filed:

Dec. 28, 1999
Applicant:
Inventors:

Yasuo Morooka, Hitachi, JP;

Hiromi Inaba, Hitachi, JP;

Takashi Nakahara, Hitachi, JP;

Takashi Okada, Hitachi, JP;

Masahiro Tobise, Hitachi, JP;

Yoshitaka Iwaji, Hitachi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 1/9408 ;
U.S. Cl.
CPC ...
G05B 1/9408 ;
Abstract

A control system for determining a control function for a control device on the basis of a transfer function of an object to be controlled and for adjusting an operation quantity of an object to be controlled in accordance with the determined control operation function, wherein an control function of a first control device is determined so that a closed-loop transfer function of a control system including the object to be controlled and the first control device coincides with a predetermined first transfer function, an control function of a second control device is determined, in a closed loop control system including the control system and the first control device, so that a transfer function from a disturbance applied to the object to be controlled to a state variable of a point at which the disturbance is applied to the object to be controlled, and a sum signal indicative of a sum of outputs of the first and second control devices is used as an operation quantity of the object to be controlled.


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