The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2001

Filed:

Oct. 31, 1998
Applicant:
Inventors:

Alexander Starikov, Fishkill, NY (US);

Douglas Seymore Goodman, Sudbury, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03C 5/10 ; G03C 5/56 ;
U.S. Cl.
CPC ...
G03C 5/10 ; G03C 5/56 ;
Abstract

A pattern is formed on a substrate by the process of providing a substrate having a surface with previously patterned features having a non-uniform electromagnetic reflectivity, applying a second image recording material to the surface, employing the features with a non-uniform physical property of reflectivity to delineate a desired pattern in the second image recording material and applying electromagnetic energy to take advantage of the reflectivity features to provide variable processing of the second material.


Find Patent Forward Citations

Starikov, Alexander. (2001). Multi-layer integrated imaging/image recording process with improved image tolerances (U.S. Patent No. 6309809). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6309809

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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