The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2001
Filed:
Aug. 25, 1998
Applicant:
Inventors:
Thomas L. Toth, Brookfield, WI (US);
Carmine F. Vara, New Berlin, WI (US);
Willi W. Hampel, St. Francis, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 3/00 ;
U.S. Cl.
CPC ...
G21K 3/00 ;
Abstract
The present invention, in one form, is an imaging system which, in one embodiment, utilizes a filter assembly including a plurality of filter portions for altering the intensity and quality of an x-ray beam. Specifically, in one embodiment, by positioning the filter assembly so that the x-ray beam is filtered by the first portion of the filter assembly, the x-ray beam is altered to perform a body portion scan. By positioning the filter assembly to the second portion, the x-ray beam is altered to perform a head portion scan.