The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2001
Filed:
Nov. 29, 1999
Applicant:
Inventors:
Hui David He, Waukesha, WI (US);
Thomas L. Toth, Brookfield, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/300 ;
U.S. Cl.
CPC ...
G01N 2/300 ;
Abstract
A method is described for optimizing signal-to-noise performance of an imaging system, including the steps of scout-scanning an object to obtain scout scan data; determining a plurality of normalized x-ray input signal factors using the scout scan data; using the normalized x-ray input signal factors to determine at least one system input signal; selecting at least one gain for the object scan using the system input signal; and applying the selected gain corresponding to the system input signal in the object scan.