The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2001

Filed:

Sep. 13, 1999
Applicant:
Inventors:

Boris Yamrom, Schenectady, NY (US);

William Thomas Hatfield, Schenectady, NY (US);

Joseph Edward Piel, Jr., Scotia, NY (US);

Ricardo Scott Avila, Clifton Park, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 ; H04R 1/700 ;
U.S. Cl.
CPC ...
A61B 8/00 ; H04R 1/700 ;
Abstract

The axis of rotational transducer array scans, because of imperfect transducer array assembly, may have two orthogonal offsets relative to the geometric center of the transducer array. Without knowledge of these offsets, it is not possible to convert rotational transducer scan data into a rectilinear (Euclidean) coordinate system, as is necessary for three-dimensional processing. Using spatial coherency between appropriate scan lines in different rotational transducer scans, the horizontal and vertical rotational offsets are calculated. These offsets are then utilized in converting the data to a rectilinear coordinate system for three-dimensional processing.


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