The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2001
Filed:
May. 18, 1999
Applicant:
Inventor:
Kiyoshi Inoue, Tokyo, JP;
Assignee:
Tanaka Systems Incorporated, Mountain View, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/16 ;
U.S. Cl.
CPC ...
G01B 7/16 ;
Abstract
Fatigue in a magnetically sensitive detector element (,) can be evaluated using the expression H∞ log(N). Employing this method, measuring changes in magnetization of the detector element (,) permit predicting fatigue with many practical applications.