The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2001
Filed:
Mar. 12, 1999
Yiping Ma, Layton, UT (US);
Eric R. Peters, Roy, UT (US);
Weimin Pan, Layton, UT (US);
Klinton D. Washburn, Roy, UT (US);
Iomega Corporation, Roy, UT (US);
Abstract
A method and apparatus for detecting defects on a surface of a recording medium in a magnetic disk apparatus. An idling state of the magnetic disk apparatus is detected and a determination is made of the duration that the recording medium has been in use. The presence/absence of defects on the surface of the recording medium is then sequentially detected, responsive to the duration and the idling state, beginning at a start location of the recording medium. Data located at a detected defect is reallocated to a predetermined storage area, and the detected defect is mapped in a defect location map.