The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2001

Filed:

Oct. 19, 1999
Applicant:
Inventors:

Akira Adachi, Otawara, JP;

Kenji Igarashi, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/300 ;
U.S. Cl.
CPC ...
G01N 2/300 ;
Abstract

A two-dimensional array type of X-ray detector, incorporated into an X-ray computerized tomography apparatus, has a plurality of X-ray detecting elements arranged in the X and Y directions for detecting incident X-rays into electric signals. A mask is placed on the X-ray incidence side of the X-ray detecting elements. The mask is formed with a pattern of shield portions in line form each extending substantially parallel to the channel direction (X direction) to shield edges of all the X-ray detecting elements arranged in the x direction from incident X-rays. Thereby, the instability of sensitivity of X-ray detection of the edges of the X-ray detecting elements and arrangement errors of the X-ray detecting elements in the slice direction (Y direction) are canceled out.


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