The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2001

Filed:

Jun. 26, 2000
Applicant:
Inventor:

Hidehiko Furuhashi, Fujisawa, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/106 ;
U.S. Cl.
CPC ...
G02B 2/106 ;
Abstract

An upright microscope comprises a microscope main body constituted of a base unit and a stand unit extending upright from the rear end of the base unit. An observation optical system comprising an objective lens and an eyepiece lens is provided at the microscope main body. A stage on which a test piece is placed is assembled into an elevator unit which is caused to move up and down by focusing knobs as an integrated part. The test piece is illuminated by a lamp from below the stage. A recessed portion is formed at the base unit and the lamp is disposed at the recessed portion. The lamp is concealed by a lid member that is attached/detached by sliding over the recessed portion. When the lid member is slid and moved off the base unit, the lamp becomes exposed. As a result, the lamp can be replaced easily.


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