The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2001
Filed:
Jan. 09, 1998
Applicant:
Inventor:
Roger Spink, Berneck, CH;
Assignee:
Leica Microsystems AG, Heerbugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/118 ; G02B 2/136 ; G02B 2/714 ; G02B 2/732 ;
U.S. Cl.
CPC ...
G02B 2/118 ; G02B 2/136 ; G02B 2/714 ; G02B 2/732 ;
Abstract
A microscope is disclosed for observing a magnified area. Fade-in means arranged in the path of the rays of the microscope reflect a thin focused beam of light into the path of the rays. The beam of light is deflected or modulated by deflecting means to supply an image that can be recognized by an observer. The image may be projected onto the object either directly or indirectly, for example through a diffusing screen.