The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2001
Filed:
May. 21, 1999
Takashi Iwasaki, Tokyo, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
A method of calculating optical frequency spectrum for use in an optical-spectrum measuring apparatus for measuring optical spectrum characteristics of a light source. In the method, a bandwidth storage section stores a characteristic of a bandwidth of passed wavelengths with respect to a measuring wavelength of a spectrometer. A CPU obtains a bandwidth of wavelengths with respect to each measuring point in accordance with the stored bandwidth of wavelengths. Then, measured intensities of light at the measuring points are used to add measured values across the measured value in a required range of bandwidth of optical frequencies. Moreover, correction is performed in accordance with a ratio of the bandwidth of wavelengths at each of the measuring points and the intervals of wavelength at the measuring points. Thus, an intensity of light at each of the measuring points is obtained.