The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2001

Filed:

Jun. 16, 1998
Applicant:
Inventor:

Zheng Jason Geng, Rockville, MD (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/00 ;
U.S. Cl.
CPC ...
H04N 7/00 ;
Abstract

An omnidirectional imaging system comprising a reflective mirror for viewing object within a hemispherical field of view form a single virtual view point at the local center of said reflective mirror, a projector for projecting a light beam toward said reflective mirror, and a variable wavelength filter optically positioned between said projector and said reflective mirror for generating a pattern having a spatially distributed wavelength spectrum of said reflective mirror, where a generator responsive to the hemispherical image data for generating three-dimensional image.


Find Patent Forward Citations

Geng, Zheng. (2001). Method and apparatus for omnidirectional imaging (U.S. Patent No. 6304285). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6304285

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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