The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2001

Filed:

Nov. 16, 1999
Applicant:
Inventors:

Michael Meyer, Baiersdorf, DE;

Hans-Peter Seubert, Heroldsbach, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 ;
U.S. Cl.
CPC ...
A61B 5/00 ;
Abstract

A multiple examination arrangement has a number of imaging systems, including at least an angiography system, a CT system and an MR system arranged in a room such that a patient lying on a patient bearing table can be selectively examined without repositioning in one of the imaging systems by a relative movement of the carrier of the imaging systems and the patient support table.


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Meyer, Michael. (2001). Multiple examination arrangement with a number of imaging systems (U.S. Patent No. 6302579). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6302579

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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