The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2001
Filed:
Dec. 10, 1999
Hideto Fujita, Kyoto, JP;
Osamu Kudo, Kyoto, JP;
Yoshiyuki Fujita, Kyoto, JP;
Toyokazu Maeda, Kyoto, JP;
Other;
Abstract
A hardness tester for a large test material is downsized by shortening a stroke length of the x-y stage. A hardness tester in accordance with the invention transfers the laser irradiating unit,two-dimensionally along the X or Y axis and irradiate a laser beam on the material W under test placed on the stage,The tester also monitors the laser beam visually and determine a target position to be measured and transfers the monitoring unit,to the determined target position along the X or Y axis and monitor the position by means of the monitoring unit,If the position does not fall on a boundary between crystals, the loading unit,is two-dimensionally transferred and forms a dent on the position by means of the penetrator,An image of the dent is captured by the monitoring unit,and the hardness is determined by calculating a diagonal length of the dent by image processing.