The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2001
Filed:
Mar. 25, 1999
Michael Charles Ostrowski, Glenville, NY (US);
Mohamed Ahmed Ali, Niskayuna, NY (US);
Philip Paul Beachamp, Rexford, NY (US);
Bijan Dorri, Clifton Park, NY (US);
Arlie Russell Martin, Ballston Spa, NY (US);
Brian Douglas Lounsberry, Thiensville, WI (US);
Michael Solomon Idelchick, Mequon, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method of generating quality matrices indicating a relationship between critical to quality characteristics and key control parameters for levels of a process. A plurality of rows of a first matrix are designated as critical to quality characteristics and a plurality of columns of the first matrix are designated as key control parameters. Each critical to quality characteristic is assigned a critical to quality weight. An interaction weight is assigned between at least one critical to quality characteristic and at least one key control parameter. A score is then generated for at least one key control parameter in response to said critical to quality weight and said interaction weight.