The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2001
Filed:
Aug. 23, 1999
Christian von Alfthan, Kauniainen, FI;
Kari Mann, Espoo, FI;
Outokumpu Oyj, Espoo, FI;
Abstract
The invention relates to an analyzer measuring window and to a method for installing said measuring window in place, said measuring window being used in essentially automatic and continuously operated measurements, particularly when analyzing the element contents of solid, liquid of slurry-like materials. Said measuring window is movable with respect to the measuring aperture provided in the wall of the measuring chamber containing the measuring head of the analyzer and to the sample aperture provided in the sample chamber. According to the invention, the measuring window is made of ribbon-like material (,) which is movable in relation to the measuring aperture (,) and to the sample chamber (,) in order to replace the measuring window (,) at least between two measuring periods, and in the immediate vicinity of the measuring aperture (,), there is installed at least one stretching member (,) in order to seal the ribbon-like material at least against the wall of the measuring aperture (,).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile