The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2001
Filed:
Jan. 23, 2001
Tae-hyun Kim, Seoul, KR;
Hyung-dong Kim, Suwon, KR;
Abstract
A semiconductor memory device capable of reducing a data test time in a pipeline is provided. The semiconductor memory device has a pad, data lines, and a data port (DQ) block including a plurality of memory cells. The semiconductor memory device includes a pipeline adapted to output data from selected memory cells of the plurality of memory cells in the DQ block to the pad via the data lines. The pipeline includes a plurality of unit pipeline cells (UPLs) connected in a series. Each of the UPLs is further connected to each of the data lines and is adapted to latch the data, wherein the data is transmitted to a subsequent UPL in the series, if any, so as to sequentially transmit the data to the pad. A comparison controller is connected to a last UPL in the series. The comparison controller is adapted to perform a test for defects in the data and to provide a result of the test to the pad during a test mode, whereby the presence or absence of defects in the DQ block is verified in synchronization with an edge of a clock signal.