The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2001

Filed:

Nov. 12, 1998
Applicant:
Inventors:

Howard P. Groger, Gainesville, FL (US);

John Raymonda, Las Cruces, NM (US);

K. Peter Lo, Blacksburg, VA (US);

Roger L. Reynolds, Blasdell, NY (US);

William F. Sullivan, Cheektowaga, NY (US);

Myron T. Coolbaugh, Christiansburg, VA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/164 ;
U.S. Cl.
CPC ...
G01N 2/164 ;
Abstract

An instrument for total internal reflection fluorescence spectroscopy having modular probe that inexpensively monitors vapors and liquid-phase analytes under field conditions is described. The system is particularly helpful in evaluating multiple analytes using the fluorescence of a material immobilized in a thin sorbent polymer coating. At the same time, the system is capable of monitoring trace quantities of analyte using a fluorescence-read immunological reaction. The device includes a diode laser source, a shaped optical element (which may be as simple as a microscope slide), and one or more amplified photodiode detectors. The shaped optical element propagates light from the diode laser in a series of internally reflective bounces.


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