The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2001

Filed:

Mar. 30, 1999
Applicant:
Inventors:

Eiji Watanabe, Chikushino, JP;

Kanji Yahiro, Onojo, JP;

Akira Higuchi, Kasuga, JP;

Naoki Miyazaki, Karatsu, JP;

Kenichi Kuroda, Fukuoka, JP;

Kenji Ishiyama, Fukuoka, JP;

Takashi Daikoku, Fukuoka, JP;

Hideyoshi Kitahara, Kasuga, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

In an automatic testing apparatus comprising, a specimen holder area adapted to hold thereon a specimen substrate for receiving therein a specimen, a reagent injector adapted to inject a reagent toward the specimen in the specimen substrate on the specimen holder area to mix the specimen with the reagent, a mixture reaction device adapted to hold thereon the specimen substrate including the mixture of the specimen and the reagent within a predetermined circumferential condition during a time period, and a transferring device for transferring the specimen substrate relative to the specimen holder area, the mixture reaction device has a take-in area to which the specimen substrate is transferred from the specimen holder area by the transferring device, and the take-in area is arranged adjacent to the specimen holder area.


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