The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2001
Filed:
Oct. 04, 1996
Applicant:
Inventors:
Kouji Hirayama, Kyoto, JP;
Michio Naka, Kyoto, JP;
Assignee:
Kyoto Daiichi Kagaku Co., Ltd., Kyoto, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/348 ;
U.S. Cl.
CPC ...
G01N 3/348 ;
Abstract
A test apparatus for assaying a component in a liquid sample by measuring a reflected light, comprising a support having a through hole or a light permeable area, a reagent layer having a detecting area fixed on the support to cover said through hole or light permeable area, and a cover which covers at least the detecting area, wherein at least a portion of the cover covering the detecting area is of a color which substantially has no influence on the reflected light at a measured wavelength.