The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2001
Filed:
Feb. 16, 2000
Applicant:
Inventor:
Tetsuyuki Miwa, Aichi, JP;
Assignee:
Nidek Co., Ltd., Aichi, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 ;
U.S. Cl.
CPC ...
A61B 3/00 ;
Abstract
An ophthalmic apparatus for measuring dryness of a cornea of an eye to be examined, the apparatus comprising a projecting optical system including a light source for projecting measurement light onto the cornea, a detecting optical system including a photodetector for detecting reflected light from a tear film by projecting the measurement light, an arithmetic device for measuring time-varying changes in the dryness of a predetermined measurement region based on a result detected by the photodetector, and an output device for outputting a measurement result obtained by the arithmetic device.