The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2001

Filed:

Dec. 11, 1998
Applicant:
Inventors:

Jeffrey V. Lindstrom, Seattle, WA (US);

R. David Reed, Seattle, WA (US);

Bradley E. Platin, Seattle, WA (US);

Kevin W. Beyer, Seattle, WA (US);

David C. Reusch, Seattle, WA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B64K 9/14 ;
U.S. Cl.
CPC ...
B64K 9/14 ;
Abstract

An accurate and compact flap skew detection system that operates independent of the flap-drive system comprises, in a preferred embodiment, three major elements; a rotary position sensor located on fixed wing structure; a push-pull link and crank arm to convert translational flap motion into rotary sensed motion at the sensor; and a computer processing means to process the rotational sensed information and to compute a flap skew algorithm. Inter-flap and intra- flap translational motion is sensed and compared using a plurality of rotary sensors. Sensors falling outside of predetermined limits or violating control law rules indicate a non-synchronous or asymmetrical “skewed” condition.


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