The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2001
Filed:
Dec. 22, 1999
Applicant:
Inventors:
Douglas J. Thomson, Winnipeg, CA;
Christopher O. Lada, Palo Alto, CA (US);
Assignee:
MFI Technologies Corporation, San Jose, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 ; G01B 7/34 ;
U.S. Cl.
CPC ...
G01B 5/28 ; G01B 7/34 ;
Abstract
A scanning force microscope probe cantilever having a reflective structure. In one embodiment, the described scanning force microscope probe cantilever includes a reflective structure on the cantilever. In one embodiment, light is directed to the reflective structure on the cantilever in a direction having a directional component from a fixed end to a free end of the cantilever. In one embodiment, light is reflected from the reflective structure in a direction having a directional component from the free end to a fixed end of the cantilever.