The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2001
Filed:
Jun. 29, 1999
Ilya Valerievich Klotchkov, St. Petersburg, RU;
Process Intelligence Limited, Guernsey, GB;
Abstract
Automatic test equipment for memory device testing with elements providing a high accuracy of transferring and receiving signals when testing a semiconductor device under test (DUT) by intelligent skew calibration of a timing system. The device for automatic skew calibration of a transceiver comprises a plurality of input registers for transmitting signals; a plurality of output registers for receiving signals; a main clock driver for generating a main clock signal; a reference clock driver for generating reference signals for calibrating the registers; the reference clock driver being associated with the main clock driver; and a plurality of phase shifters comprising at least one set of phase shifters associated with each plurality of registers, for the relative alignment of the register's timing within each plurality. The calibration is performed using a common time base which is distributed by means of a transmission line having predetermined wave characteristics.