The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2001
Filed:
Jan. 04, 1999
Applicant:
Inventors:
Hayden C. Cranford, Jr., Apex, NC (US);
Eirik Gude, Burlington, VT (US);
Joseph A. Iadanza, Hinesburg, VT (US);
Paul A. Owczarski, Raleigh, NC (US);
Jonathan H. Raymond, Jericho, VT (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G01R 3/108 ; G06F 1/100 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G01R 3/108 ; G06F 1/100 ;
Abstract
A system and method for testing the most complex portions of transceiver devices integrated into digital VLSI chips. The testing is performed in a manufacturing environment with minimal external hardware and using a combination of test-specific circuitry and pattern algorithms built into a mixed signal transceiver implementing a test methodology suitable for application and measurement on a digital tester.