The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2001

Filed:

Mar. 05, 1999
Applicant:
Inventors:

Joseph Benco, Germansville, PA (US);

Ratan Das, Allentown, PA (US);

Cliff Downs, Richboro, PA (US);

Assignee:

ABB Power T&D Company Inc., Raleigh, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/106 ;
U.S. Cl.
CPC ...
G01R 2/106 ;
Abstract

A method for measuring a fundamental frequency of a power system comprises sampling voltage and current waveforms associated with the power system, wherein the voltage and current waveforms are characterized by a fundamental frequency component that may vary over time. Next, determine whether, according to a prescribed frequency tracking criterion, a present value of the fundamental frequency can be measured using voltage samples. If so, measure the fundamental frequency using the voltage samples, and set a best available value (“freq”) equal to the measured value based on voltage samples. If the fundamental frequency cannot be measured using the voltage samples, determine whether, according to the prescribed frequency tracking criterion, the present value of the fundamental frequency can be measured using current samples. If so, measure the fundamental frequency using the current samples and set the best available value equal to the measured value based on current samples. If the present value of the fundamental frequency cannot be measured using the voltage or current samples, determine whether previously measured values of the fundamental frequency based on current are stable according to a prescribed stability criterion and, if so, set the best available value to a value based on the previously measured values for a limited period of time.


Find Patent Forward Citations

Benco, Joseph. (2001). Current based frequency tracking method and apparatus (U.S. Patent No. 6298309). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6298309

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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