The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2001
Filed:
Sep. 21, 1999
Hisao Kitagawa, Kunitachi, JP;
Yasushi Aono, Yokohama, JP;
Kazuhiko Osa, Hachioji, JP;
Yosuke Kishi, Yokohama, JP;
Yoshihiro Shimada, Sagamihara, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
An inverted microscope is provided that reflects an observation light passing through an image-formation optical system upward using at least one reflection optical system and that leads the observation light to an observation path. The inverted microscope includes a confocal scanner arranged at an image surface position of the image-formation optical system, a light source for applying light onto a sample through the confocal scanner and the image-formation optical system, and a confocal image formation optical system that leads the light passing through the confocal scanner to the sample through the image-formation optical system, returns a return light from the sample to the confocal scanner along a route opposite to that for leading the light to the sample, and obtains a confocal image. A confocal observation optical system is also provided for leading the return light from the sample passing through the optical scanner to the observation optical path.