The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2001

Filed:

Feb. 11, 1999
Applicant:
Inventors:

Jules D. Campbell, Jr., Austin, TX (US);

Jiang Chen, Austin, TX (US);

Robert S. Jones, III, Austin, TX (US);

Christian Ahrens, Austin, TX (US);

Scott Willard Herrin, Round Rock, TX (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 ; H03M 1/10 ;
U.S. Cl.
CPC ...
H03M 1/06 ; H03M 1/10 ;
Abstract

A data processing system (,) includes a plurality of modules (,) and an analog-to-digital converter (ADC) (,). The ADC (,) includes at least one port terminal (,) for transmitting test information from the ADC (,). The plurality of modules (,) and the ADC (,) are coupled to a central processing unit (CPU) (,) via an intermodule bus (,). A tester can exchange test information with the ADC (,) directly through the port terminal (,) instead of using the intermodule bus (,). Also, various sub-modules (,) of the ADC (,) can be independently tested without performing a conversion process.


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