The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2001

Filed:

Nov. 04, 1999
Applicant:
Inventor:

Yumi Saito, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ; G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/126 ; G01R 3/102 ;
Abstract

In a test system, a plurality of semiconductor devices (samples) to be tested are connected in parallel. Resistors and switches are connected to the respective semiconductor devices in series. A voltage source (power supply) supplies a constant voltage for the respective semiconductor devices. An ammeter measures current that flows through the respective semiconductor devices. A voltmeter measures the respective voltage drops of the resistors. A controller detects the specific resistor that is changed in a resistance value when the current measured by the ammeter is reduced, and turns off the switch connected to the specific resistor.


Find Patent Forward Citations

Saito, Yumi. (2001). Test system for testing semiconductor device (U.S. Patent No. 6297659). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6297659

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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