The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2001
Filed:
Jan. 21, 2000
Bernd Strutt, Steinen, DE;
Bernhard Michalski, Maulburg, DE;
Other;
Abstract
An apparatus for determining a physical process variable of a medium (,) which can be used in conjunction with various sensor types, the sensors having in common that they determine a process variable by means of a delay-time method. The apparatus has a sensor (,), a sensor-specific application unit (,) and an evaluation unit (,), which is essentially independent of the sensor type used, the sensor (,) being assigned a transmitting/receiving unit (,), the transmitting unit (,) transmitting measuring signals in the direction of the medium (,) and the receiving unit (,) receiving the measuring signals influenced by the interaction with the medium (,), and the application unit (,) being designed in such a way that it provides measurement data, independently of the type of sensor (,) used, from which the evaluation unit (,) determines the physical process variable using a delay-time method by means of a uniform evaluation algorithm.