The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2001

Filed:

Apr. 02, 1999
Applicant:
Inventors:

Shiva P. Gowni, San Jose, CA (US);

Alpesh B. Patel, Fremont, CA (US);

Bo B. Wang, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A design, layout, schematic, netlist, abstract or other equivalent circuit representations for a memory that may have redundant circuitry may be generated from a set of user inputs acquired through a graphical user interface. Based on the user inputs one or more leaf cells is/are generated. Then using the leaf cells, a design database for the layout is generated from the user inputs. The design database reflects physical hierarchies of the layout and may include redundancy circuitry within a data and/or address path, parallel to a non-redundant data and/or address path within the layout. The above-mentioned parameters described by the user inputs may include an array size, a defect rate, and/or a leaf cell design, layout or schematic. This scheme may be embodied as a set of computer-readable instructions, for example to be executed by a computer system. The user may rearrange the memory array architecture by changing a parameter selected from the group consisting of array size, defect rate, line width, line spacing, line length, gate width, transistor spacing, gate length, transistor length, resistivity, capacitance, and other physical and/or electrical device parameters.


Find Patent Forward Citations

Loading…