The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2001

Filed:

Apr. 14, 1999
Applicant:
Inventor:

Kiyotake Togo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 2/900 ; G01R 3/128 ;
U.S. Cl.
CPC ...
G11C 2/900 ; G01R 3/128 ;
Abstract

A memory device has a main memory circuit, an auxiliary memory circuit for storing test data, and an interface circuit for transferring test data between the auxiliary memory circuit and external test equipment. Test data are transferred from the external test equipment to the auxiliary memory circuit, then transferred repeatedly to different locations in the main memory circuit. Different test patterns are generated by selectively inverting one bit, or all bits, in the test data as the data are transferred into the main memory circuit. Test results are obtained by using a comparator in the memory device to compare the data stored in the auxiliary memory circuit with data read from the main memory circuit.


Find Patent Forward Citations

Togo, Kiyotake. (2001). Memory test facilitation circuit using stored test data repeatedly (U.S. Patent No. 6295620). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6295620

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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