The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2001
Filed:
Jun. 30, 1998
Applicant:
Inventor:
Satoru Sonobe, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11G 2/900 ;
U.S. Cl.
CPC ...
G11G 2/900 ;
Abstract
In the test, the semiconductor memory device capable of error correction is tested to judge whether or not errors which exceed the correction ability of the error correction occur in the memory section of the device. As a result of the test, the semiconductor memory device in question is judged normal when errors occurring therein do not exceed the correction ability. The device subjected to the test is determined not to have any serious problem, even if it includes any errors, since such errors are always corrected by error correction of the device. Thus, according to this invention, the yield of the semiconductor memory device drastically can increase.