The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2001
Filed:
Apr. 11, 2000
Brian Scott Czuhai, Belleville, MI (US);
Charles L. Cole, Livonia, MI (US);
Hui Wang, West Bloomfield, MI (US);
Visteon Global Technologies, Inc., Dearborn, MI (US);
Abstract
A method and system are provided for invoking and monitoring of tests executed by multiple, diverse control systems/algorithms on a main controller which allows a single monitor system to be used to monitor the test results without requiring the monitor system to be programmed or individually tailored to process each unique output from the different possible tests. The present invention achieves independence between the monitor system and each of the specific test applications on the main controller by normalizing the unique results of each of the tests to a common value, thereby allowing the monitor system to generate expected results that can be used with any of the possible tests.