The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2001
Filed:
Feb. 28, 2000
Yoshihisa Kayanaka, Aichi-ken, JP;
Ryohei Komiya, Nagoya, JP;
Takeshi Kawaguchi, Kounan, JP;
Toshihiko Ikeda, Kounan, JP;
Michiyo Amano, Gifu, JP;
Yumiko Takeda, Nagoya, JP;
Satoru Makino, Nagoya, JP;
Brother Kogyo Kabushiki Kaisha, Nagoya, JP;
Abstract
A CPU selects a line segment, whose both endpoints constructing a part of a quilt design are on a periphery, and then selects a line segment, which separates a piece from the quilt design on a piece-by-piece basis so that the separated piece will not have a line segment to become a separation line, from the selected line segments, after separation. When the line segment can be selected, a piece is separated from the quilt design at the selected line segment on a piece-by-piece basis. Then, the CPU determines that the quilt design, whose one piece has been separated, is the object to be determined, and separates pieces from the quilt design on a piece-by-piece basis. When all line segments are used for the separation, an applicability determination flag is set, because all pieces in the quilt design are separated into pieces on the piece-by-piece basis.