The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2001
Filed:
Oct. 19, 1999
Applicant:
Inventors:
Til Aach, Aachen, DE;
Dietmar W. Kunz, Aachen, DE;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/34 ;
U.S. Cl.
CPC ...
H05G 1/34 ;
Abstract
An x-ray examination apparatus comprises an x-ray source for generating an x-ray image and an image analysis system derives brightness variations from the x-ray image and derives a dose control signal dependent on said brightness variations in order to control the x-ray source. The image analysis system derives a distribution of said brightness variations and derives the dose control signal from the distribution of brightness variations. Preferably, the image analysis system is arranged to derive the brightness variations from the processed image and a histogram analysis is employed to derive the dose control signal.