The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2001

Filed:

Dec. 15, 1999
Applicant:
Inventors:

John Allen Hoffnagle, San Jose, CA (US);

Carl Michael Jefferson, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 1/318 ;
U.S. Cl.
CPC ...
G02B 1/318 ;
Abstract

An optical system having a first positive optical element having an aspherical surface; and a second positive optical element having an aspherical surface. The first and second optical elements are arranged in a Keplerian configuration. The aspheric surface of the second optical element is related to the aspheric surface of the first optical element by a ray-tracing function that maps substantially all of an input light beam that is incident to the first optical element to a collimated output light beam that is output from the second optical element. The input light beam has a first axially-symmetric intensity distribution, such as a Gaussian intensity distribution, and the output light beam has a second axially-symmetric intensity distribution, such as a continuous, sigmoidal intensity distribution. Preferably, the output light beam has a Fermi-Dirac intensity distribution, and the ray-tracing function maps the input light beam to the output beam to a 1/e,intensity radius of the input light beam.


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