The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2001
Filed:
Nov. 07, 1997
Applicant:
Inventors:
John J. Carrino, San Diego, CA (US);
John R. Ertl, Racine, WI (US);
John A. Salituro, Racine, WI (US);
Paul M. Jung, Chicago, IL (US);
Assignee:
Abbott Laboratories, Abbott Park, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C07H 2/102 ; C07H 2/104 ; C07H 2/100 ;
U.S. Cl.
CPC ...
C07H 2/102 ; C07H 2/104 ; C07H 2/100 ;
Abstract
Provided herein is a method for detecting the presence of a target nucleic acid sequence in a sample. The present method uses a combination of dual labeled probes and heterogeneous detection methods.
Carrino, John. (2001). Analyte detection process using dual labeled probes (U.S. Patent No. 6294326). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6294326
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile