The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2001

Filed:

Aug. 08, 1996
Applicant:
Inventors:

David F. Muller, Boston, MA (US);

Mike D'Agati, Brighton, MA (US);

Marc Friedman, Watertown, MA (US);

Troy Harmon, Landsdale, PA (US);

Peter Klopotek, Framingham, MA (US);

Alex Sacharoff, Framingham, MA (US);

Evan Sherr, Wellesley, MA (US);

Assignee:

Summit Technology, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 9/08 ;
U.S. Cl.
CPC ...
A61F 9/08 ;
Abstract

The invention features improvements in PRK procedures that relate to preventing non-uniform removal of material from the corneal surface. It has been realized that photoablation by-products resulting during the PRK procedure can affect the accuracy and the predictability of the procedure. Under certain conditions, the plume of photoablation by-products that have left the corneal surface can non-uniformly redeposit onto the ablation area and thus affect the uniformity of subsequent material removal. The plume of photoablation by-products, in the space above the corneal surface, can also non-uniformly affect the escape of further photoablation products from the surface. In addition to the plume effects, it has been realized that the hydration level of the corneal tissue during the PRK procedure can vary over the ablation area and likewise non-uniformly affect the PRK procedure.


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