The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2001
Filed:
May. 11, 1999
Lee E. Elliott, Torrance, CA (US);
Michael K. MacKay, Palos Verdes Estates, CA (US);
John V. Flannery, Redondo Beach, CA (US);
TRW Inc., Redondo Beach, CA (US);
Abstract
A technique for measuring distortion in a structure of interest, such as a spacecraft antenna reflector (,), and optionally compensating for the distortion. A first set of targets (,) on the structure (,) is scanned by an attitude transfer system (,) to measure the angular location and range of each target relative to a reference point on another structure (,) having a frame of reference. The orientation of the structure of interest is them determined from the measured locations of the targets. A second set of targets (,or,) on the structure of interest is scanned by a figure sensing module (,) located at a reference point on the structure itself. From measured angular locations and ranges of the second set of targets, any shape distortion in the structure of interest can be determined, and distortion may be corrected with the use of actuators (,).