The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2001
Filed:
Dec. 09, 1998
Applicant:
Inventors:
Petrus W. J. Linders, Eindhoven, NL;
Hendrik J. Meulenbrugge, Eindhoven, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/00 ;
U.S. Cl.
CPC ...
G01T 1/00 ;
Abstract
An X-ray examination apparatus includes an X-ray detector for deriving an image signal from an X-ray image. The X-ray detector has an essentially elongate X-ray-sensitive surface. The X-ray sensitive surface of the X-ray detector corresponds notably to a relevant part of the object to be examined.
Linders, Petrus W. J.. (2001). X-ray examination apparatus (U.S. Patent No. 6292534). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6292534
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile