The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2001

Filed:

Feb. 17, 1999
Applicant:
Inventors:

Toshio Norita, Osaka, JP;

Hiroshi Uchino, Kyoto, JP;

Assignee:

Minolta Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/124 ; G01B 1/114 ; G01N 2/186 ;
U.S. Cl.
CPC ...
G01B 1/124 ; G01B 1/114 ; G01N 2/186 ;
Abstract

A 3D measuring apparatus is disclosed, in which a light beam is projected in such a manner as to raster scan toward a virtual surface. Specific data corresponding to the angle of incidence of the light beam is output, which light beam is reflected from an object of measurement at the time point of passing through each of a plurality of sampling sections into which the virtual surface is segmented in the main scanning direction X and the subsidiary scanning direction Y. With the position data Xg in the main scanning direction and the position data Yg in the subsidiary scanning direction for each sampling section as an address, the specific data are written in a memory. Also, the incident light beam is received by a photo-electric conversion device of one-dimensional position detection type, and the optical image of the object is compressed unidirectionally and formed on the photo-detection surface of the photo-electric conversion device.


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Norita, Toshio. (2001). Three-dimensional measuring apparatus (U.S. Patent No. 6292263). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6292263

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