The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2001

Filed:

Aug. 27, 1998
Applicant:
Inventor:

Hitoshi Sakano, Yokohama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 ; G02B 2/136 ; G02B 2/300 ;
U.S. Cl.
CPC ...
H04N 7/18 ; G02B 2/136 ; G02B 2/300 ;
Abstract

When an image of a sample is photographed by an image pickup device and it is converted into an electric signal, then the electric signal is converted by a controller into a signal suitable for a display unit, and the image of the sample is displayed on a screen of the display unit. A light flux from the screen of the display unit is guided by an optical system to an observing optical system. The display screen, on which the image of the sample is displayed, can be observed through an eyepiece lens of the observing optical system. Accordingly, it is easy to confirm the relationship between the size of the picture element of the image pickup device and the image to be photographed and the resolving power for the image intended to be photographed. The display unit and the image pickup device are accommodated in a microscope housing. Therefore, the installation area and the size can be made equivalent to those used for the conventional system.


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