The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2001

Filed:

Nov. 21, 1997
Applicant:
Inventors:

Gautam P. Vaswani, Austin, TX (US);

Daniel Wilde, Cedar Park, TX (US);

Assignee:

Cirrus Logic, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/140 ;
U.S. Cl.
CPC ...
G06T 1/140 ;
Abstract

Graphics software renders polygons with texture using an improved MIP mapping technique in which texels from multiple MIP maps are blended together. The software renders the pixels in a polygon and selects texture elements (“texels”) from an appropriate texture map to be applied to the pixels. The software further generates texel coordinate values to select texel values from a set of texture maps, each map varying from the others by the level of detail of the texture. The software then computes a scale factor for each texel value according an area bounded by adjacent texel coordinates. In one embodiment, vectors are defined for each the adjacent texels and the area is determined from the magnitude of the cross product of the vectors. The scale factor is then used to compute a weighted average of texels from one or more MIP maps. Further, for certain area values, no averaging occurs or, alternatively, the scale factor is set to 1.0.


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